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Structural determination of the Si(111) √3×√3-Bi surface by x-ray standing waves and scanning tunneling microscopy
Woicik, J. C., Franklin, G. E., Liu, Chien, Martinez, R. E., Hwong, I.-S., Bedzyk, M. J., Patel, J. R., Golovchenko, J. A.Volume:
50
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.50.12246
Date:
October, 1994
File:
PDF, 405 KB
english, 1994