![](/img/cover-not-exists.png)
Dependence of plasmon polaritons on the thickness of indium tin oxide thin films
Rhodes, C., Cerruti, M., Efremenko, A., Losego, M., Aspnes, D. E., Maria, J.-P., Franzen, S.Volume:
103
Year:
2008
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2908862
File:
PDF, 1.05 MB
english, 2008