[IEEE 2010 Chinese Control and Decision Conference (CCDC) -...

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[IEEE 2010 Chinese Control and Decision Conference (CCDC) - Xuzhou, China (2010.05.26-2010.05.28)] 2010 Chinese Control and Decision Conference - New method of fault feature extraction based on supervised LLE

Quansheng Jiang,, Jiayun Lu,, Minping Jia,
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Year:
2010
Language:
english
DOI:
10.1109/ccdc.2010.5498459
File:
PDF, 152 KB
english, 2010
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