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[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - A universal technique for accelerating simulation of scan test patterns
Oomman, B.G., Wu-Tung Cheng,, Waicukauski, J.Year:
1996
Language:
english
DOI:
10.1109/test.1996.556955
File:
PDF, 756 KB
english, 1996