[IEEE 2012 International Conference on Manipulation,...

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[IEEE 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Xi'an, China (2012.08.29-2012.09.1)] 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Numerical simulation about trapping two particles in microfluidic dielectrophoretic chip

Chen, Liguo, Li, Shaoqian, Cui, Haihang, Zheng, Xu
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Year:
2012
Language:
english
DOI:
10.1109/3m-nano.2012.6472944
File:
PDF, 742 KB
english, 2012
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