[IEEE 2007 8th International Conference on Electronic Measurement and Instruments - Xian, China (2007.08.16-2007.07.18)] 2007 8th International Conference on Electronic Measurement and Instruments - A Genetic Training Algorithm of Wavelet Neural Networks for Fault Prognostics in Condition Based Maintenance
Lei, Zhang, Li Xingshan,, Jinsong, Yu, ZhanBao, GaoYear:
2007
Language:
english
DOI:
10.1109/icemi.2007.4350749
File:
PDF, 521 KB
english, 2007