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[IEEE 17th International Zurich Symposium on Electromagnetic Compatibility - Singapore (2006.02.27-2006.03.3)] 2006 17th International Zurich Symposium on Electromagnetic Compatibility - HPEM and HEMP susceptibility assessments of computer equipment
Ho, R., Lambourne, A., Wraight, A.Year:
2006
DOI:
10.1109/EMCZUR.2006.214896
File:
PDF, 2.03 MB
2006