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Residual stress evolution in multilayer ceramic capacitors corresponding to layer increase and its correlation to the dielectric constant
Park, Jong-Sung, Kim, Sujin, Shin, Hyunho, Jung, Hyun Suk, Hong, Kug SunVolume:
97
Year:
2005
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1894602
File:
PDF, 1.08 MB
english, 2005