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sp[sup 3]/sp[sup 2] ratio in amorphous-carbon thin film by spectroscopic ellipsometry
Li, W. J., Song, Z. R., Yu, Y. H., Wang, X., Zou, S. C., Shen, D. S.Volume:
94
Year:
2003
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1576304
File:
PDF, 395 KB
english, 2003