[IEEE 2013 IEEE XXXIII International Scientific Conference on Electronics and Nanotechnology (ELNANO 2013) - Kiev (2013.4.16-2013.4.19)] 2013 IEEE XXXIII International Scientific Conference Electronics and Nanotechnology (ELNANO) - Timing yield and reliability improvement of carbon nano-tube FET based digital circuits with statistical driven correlation-aware placement
Jalali, Amir, Pedram, HosseinYear:
2013
Language:
english
DOI:
10.1109/elnano.2013.6552009
File:
PDF, 301 KB
english, 2013