Comparing the accuracy of critical-current measurements using the voltage-current simulator
Aized, D., Haddad, J.W., Joshi, C.H., Goodrich, L.F., Srivastava, A.N.Volume:
30
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/20.305662
Date:
July, 1994
File:
PDF, 253 KB
english, 1994