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A compact x-ray beam intensity monitor using gas amplified sample current measurement
Hayakawa, Shinjiro, Kobayashi, Kazuo, Gohshi, YohichiVolume:
71
Year:
2000
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1150153
File:
PDF, 310 KB
english, 2000