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[IEEE 2012 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2012.10.14-2012.10.18)] 2012 IEEE International Integrated Reliability Workshop Final Report - Reverse bias stress test of GaN HEMTs for high-voltage switching applications
Dammann, M., Czap, H., Ruster, J., Baeumler, M., Gutle, F., Waltereit, P., Benkhelifa, F., Reiner, R., Casar, M., Konstanzer, H., Muller, S., Quay, R., Mikulla, M., Ambacher, O.Year:
2012
Language:
english
DOI:
10.1109/iirw.2012.6468930
File:
PDF, 510 KB
english, 2012