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Design and noise model for CCD-based, time-resolved PHA measurements
Schooff, R., Diem, S., Fonck, R., Reinke, M., Tritz, K.Volume:
74
Year:
2003
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1535246
File:
PDF, 563 KB
english, 2003