Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy
Chiam, S. Y., Chim, W. K., Huan, A. C. H., Pan, J. S., Zhang, J.Volume:
88
Year:
2006
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2159567
File:
PDF, 342 KB
english, 2006