Methodology of Statistical RTS Noise Analysis With...

IEEE Transactions on Circuits and Systems I: Regular Papers 2010 / 05 Vol. 57; Iss. 5

Methodology of Statistical RTS Noise Analysis With Charge-Carrier Trapping Models

Tong Boon Tang,, Murray, Alan F, Roy, Scott
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Volume:
57
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI:
10.1109/tcsi.2010.2043988
Date:
May, 2010
File:
PDF, 850 KB
english, 2010
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