Characteristics for Long-Channel MOSFETs With Leaky...

IEEE Transactions on Semiconductor Manufacturing 2008 Vol. 21; Iss. 1

Characteristics for Long-Channel MOSFETs With Leaky Dielectrics: Mechanisms and Reconstruction

Lee, Wei, Su, Pin, Su, Ke-Wei, Chiang, Chung-Shi, Liu, Sally
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Volume:
21
Year:
2008
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/tsm.2007.914374
File:
PDF, 518 KB
english, 2008
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