Versatile low-temperature atomic force microscope with in situ piezomotor controls, charge-coupled device vision, and tip-gated transport measurement capability
Lee, Jhinhwan, Chae, Jungseok, Kim, Chung Koo, Kim, Hyunjin, Oh, Seungeun, Kuk, YoungVolume:
76
Year:
2005
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.2018352
File:
PDF, 811 KB
english, 2005