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Multiple-scattering evaluation of RHEED intensities from the GaAs(001)2×4 surface: Evidence for subsurface relaxation
McCoy, J. M., Korte, U., Maksym, P. A., Meyer-Ehmsen, G.Volume:
48
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.48.4721
Date:
August, 1993
File:
PDF, 419 KB
english, 1993