[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - Fanout-based fault diagnosis for open faults on pass/fail information
Yamazaki, Koji, Takamatsu, YuzoYear:
2006
Language:
english
DOI:
10.1109/ats.2006.260954
File:
PDF, 296 KB
english, 2006