Comments on “Application of the interface capacitance model...

Applied Physics Letters 2006 Vol. 89; Iss. 19

Comments on “Application of the interface capacitance model to thin film relaxors and ferroelectrics” [Appl. Phys. Lett. 88, 262904 (2006)]

Gregg, J. M.
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Volume:
89
Year:
2006
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2385627
File:
PDF, 307 KB
english, 2006
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