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Ultrathin transition-metal oxide films: Thickness dependence of the electronic structure and local geometry in MnO
Nagel, Mathias, Biswas, Indro, Nagel, Peter, Pellegrin, Eric, Schuppler, Stefan, Peisert, Heiko, Chassé, ThomasVolume:
75
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.75.195426
Date:
May, 2007
File:
PDF, 385 KB
english, 2007