[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley,...

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[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - Special session 12A: Hot topic counterfeit IC identification: How can test help?

Polian, Ilia, Tehranipoor, Mohammad, Polian, Ilia, Tehranipoor, Mohammad
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Year:
2013
Language:
english
DOI:
10.1109/vts.2013.6548944
File:
PDF, 59 KB
english, 2013
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