X-ray diffraction determination of the effect of various...

X-ray diffraction determination of the effect of various passivations on stress in metal films and patterned lines

Flinn, Paul A., Chiang, Chien
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Volume:
67
Year:
1990
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.345411
File:
PDF, 771 KB
english, 1990
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