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[IEEE 2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (2010 NSS/MIC) - Knoxville, TN (2010.10.30-2010.11.6)] IEEE Nuclear Science Symposuim & Medical Imaging Conference - Charge relaxation and gain depletion for candidate secondary electron emission materials
Insepov, Z, Ivanov, V, Elam, J, Adams, B, Frisch, HYear:
2010
Language:
english
DOI:
10.1109/nssmic.2010.5873957
File:
PDF, 1.08 MB
english, 2010