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[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - RF and hot carrier effects in metal gate/high-k dielectric nMOSFETs at cryogenic temperature
Sagong, Hyun Chul, Lee, Kyong Taek, Hong, Seung-Ho, Choi, Hyun-Sik, Choi, Gil-Bok, Baek, Rock-Hyun, Song, Seung-Hyun, Park, Min-Sang, Kim, Jae Chul, Jeong, Yoon-Ha, Jung, Sung-Woo, Kang, Chang YongYear:
2009
Language:
english
DOI:
10.1109/irps.2009.5173397
File:
PDF, 254 KB
english, 2009