High-precision measurement of the half-life of Ga62
Blank, B., Savard, G., Döring, J., Blazhev, A., Canchel, G., Chartier, M., Henderson, D., Janas, Z., Kirchner, R., Mukha, I., Roeckl, E., Schmidt, K., Żylicz, J.Volume:
69
Language:
english
Journal:
Physical Review C
DOI:
10.1103/PhysRevC.69.015502
Date:
January, 2004
File:
PDF, 518 KB
english, 2004