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Simplified embedding schemes for the quantum-chemical description of neutral and charged point defects in SiO[sub 2] and related dielectrics
Erbetta, Davide, Ricci, Davide, Pacchioni, GianfrancoVolume:
113
Year:
2000
Language:
english
Journal:
The Journal of Chemical Physics
DOI:
10.1063/1.1323957
File:
PDF, 774 KB
english, 2000