[IEEE 2007 International Semiconductor Device Research Symposium - College Park, MD, USA (2007.12.12-2007.12.14)] 2007 International Semiconductor Device Research Symposium - Analysis of the mechanism and characteristic for energy loss in a gate-commutated thyristor
Zhang, Ru-Liang, Gao, Yong, Chen, Xi, Wang, Cai-LinYear:
2007
Language:
english
DOI:
10.1109/isdrs.2007.4422353
File:
PDF, 210 KB
english, 2007