[IEEE 2007 IEEE Workshop on Microelectronics and Electron Devices - Boise, ID, USA (2007.04.20-2007.04.20)] 2007 IEEE Workshop on Microelectronics and Electron Devices - Pre-Metal Dielectric Impact on Field Transistor Vt Shift in an 80V Technology
Williams, Brett, Haskett, Thomas, Sorenson, Brent, Giraud, John, Corsetti, ToddYear:
2007
Language:
english
DOI:
10.1109/wmed.2007.368053
File:
PDF, 1.25 MB
english, 2007