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[IEEE 2007 8th International Conference on Electronic Measurement and Instruments - Xian, China (2007.08.16-2007.07.18)] 2007 8th International Conference on Electronic Measurement and Instruments - Application of Multisim8 in the Circuits Fault Simulation
Lu Changhua,, Lingfei, Wang, Yong, Wang, Dawei, LiuYear:
2007
Language:
english
DOI:
10.1109/icemi.2007.4351128
File:
PDF, 491 KB
english, 2007