Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example
Schubert, M., Rheinländer, B., Franke, E., Neumann, H., Tiwald, T. E., Woollam, J. A., Hahn, J., Richter, F.Volume:
56
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.56.13306
Date:
November, 1997
File:
PDF, 205 KB
english, 1997