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[IEEE 2004 International Conference on Microelectronic Test Structures - Awaji Yumebutai, Japan (22-25 March 2004)] Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) - Test structures to verify ESD robustness of on-glass devices in LTPS technology

Ming-Dou Ker,, Chih-Kang Deng,, Sheng-Chieh Yang,, Yaw-Ming Tasi,
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Year:
2004
Language:
english
DOI:
10.1109/icmts.2004.1309293
File:
PDF, 365 KB
english, 2004
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