[IEEE CAS 2001 International Semiconductor Conference - Sinaia, Romania (9-13 Oct. 2001)] 2001 International Semiconductor Conference. CAS 2001 Proceedings (Cat. No.01TH8547) - Static and dynamic characterization of MOS capacitors containing nano-crystal silicon dots
Montes, L., Ferraton, S., Ionica, I., Mescot, X., Zimmermann, J.Year:
2001
Language:
english
DOI:
10.1109/smicnd.2001.967499
File:
PDF, 357 KB
english, 2001