![](/img/cover-not-exists.png)
[IEEE 2013 IEEE 63rd Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2013.05.28-2013.05.31)] 2013 IEEE 63rd Electronic Components and Technology Conference - Piezoresistive stress sensor for inline monitoring during assembly and packaging of QFN
Schreier-Alt, Thomas, Chmiel, Gerhard, Ansorge, Frank, Lang, Klaus-DieterYear:
2013
Language:
english
DOI:
10.1109/ectc.2013.6575874
File:
PDF, 1.56 MB
english, 2013