Auger and electron-energy-loss spectroscopy study of interface formation in the Ti-Si system
Wallart, X., Nys, J. P., Zeng, H. S., Dalmai, G., Lefebvre, I., Lannoo, M.Volume:
41
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.41.3087
Date:
February, 1990
File:
PDF, 512 KB
english, 1990