Monitoring high-yields processes with defects count in...

Applied Mathematics and Computation 2007 Vol. 188; Iss. 1

Monitoring high-yields processes with defects count in nonconforming items by artificial neural network

Babak Abbasi, Seyed Taghi Akhavan Niaki
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Volume:
188
Year:
2007
Language:
english
Pages:
9
Journal:
Applied Mathematics and Computation
DOI:
10.1016/j.amc.2006.09.114
File:
PDF, 280 KB
english, 2007
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