![](/img/cover-not-exists.png)
[IEEE 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2010.11.7-2010.11.11)] 2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Native-conflict-aware wire perturbation for double patterning technology
Chen, Szu-Yu, Chang, Yao-WenYear:
2010
Language:
english
DOI:
10.1109/iccad.2010.5654200
File:
PDF, 945 KB
english, 2010