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[IEEE 2007 International Symposium on Information Technology Convergence (ISITC 2007) - Jeonju, Korea (2007.11.23-2007.11.24)] 2007 International Symposium on Information Technology Convergence (ISITC 2007) - Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms
Lee, Jia Keat, Phon-Amnuaisuk, Somnuk, Chew, Huat Chin, Ho, Chin KuanYear:
2007
Language:
english
DOI:
10.1109/isitc.2007.45
File:
PDF, 281 KB
english, 2007