![](/img/cover-not-exists.png)
[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Record RF performance of sub-46 nm L/sub gate/ NFETs in microprocessor SOI CMOS technologies
Sungjae Lee,, Wagner, L., Jagannathan, B., Csutak, S., Pekarik, J., Zamdmer, N., Breitwisch, M., Ramachandran, R., Freeman, G.Year:
2005
Language:
english
DOI:
10.1109/iedm.2005.1609317
File:
PDF, 326 KB
english, 2005