![](/img/cover-not-exists.png)
[IEEE 2011 Electrical Insulation Conference (EIC) (Formerly EIC/EME) - Annapolis, MD, USA (2011.06.5-2011.06.8)] 2011 Electrical Insulation Conference (EIC). - Sensitivity in partial discharge detection
Chen, Mu-Kuen, Cheng, Chao-Yuan, Chen, Jeng-MingYear:
2011
Language:
english
DOI:
10.1109/eic.2011.5996138
File:
PDF, 529 KB
english, 2011