[IEEE IC's (ISPSD) - Orlando, FL, USA (2008.05.18-2008.05.22)] 2008 20th International Symposium on Power Semiconductor Devices and IC's - Exploring the Silicon Design Limits of Thin Wafer IGBT Technology: The Controlled Punch Through (CPT) IGBT
Vobecky, J., Rahimo, M., Kopta, A., Linder, S.Year:
2008
Language:
english
DOI:
10.1109/ispsd.2008.4538901
File:
PDF, 468 KB
english, 2008