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[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Analytical model for RESET operation of Phase Change Memory

Rajendran, B., Karidis, J., Lee, M-H., Breitwisch, M., Burr, G. W., Shih, Y-H., Cheek, R., Schrott, A., Lung, H-L., Lam, C.
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Year:
2008
Language:
english
DOI:
10.1109/iedm.2008.4796748
File:
PDF, 359 KB
english, 2008
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