[IEEE 2007 International Semiconductor Device Research...

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[IEEE 2007 International Semiconductor Device Research Symposium - College Park, MD, USA (2007.12.12-2007.12.14)] 2007 International Semiconductor Device Research Symposium - Properties of high-performance phototransistor photodetector (PTPD) in standard SiGe BiCMOS technology

Kuang-Sheng Lai,, Ji-Cheng Huang,, Klaus Y.-J. Hsu,
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Year:
2007
Language:
english
DOI:
10.1109/isdrs.2007.4422532
File:
PDF, 261 KB
english, 2007
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