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Dual-probe scanning tunneling microscope for study of nanoscale metal-semiconductor interfaces
W. Yi, I. I. Kaya, I. B. Altfeder, I. Appelbaum, D. M. Chen, V. NarayanamurtiYear:
2005
Language:
english
DOI:
10.1063/1.1938969
File:
PDF, 392 KB
english, 2005