Coincidence of the Rao Test, Wald Test, and GLRT in...

IEEE Signal Processing Letters 2008 Vol. 15

Coincidence of the Rao Test, Wald Test, and GLRT in Partially Homogeneous Environment

De Maio, A., Iommelli, S.
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Volume:
15
Year:
2008
Language:
english
Journal:
IEEE Signal Processing Letters
DOI:
10.1109/lsp.2008.920016
File:
PDF, 122 KB
english, 2008
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