![](/img/cover-not-exists.png)
[IEEE 2011 Future of Instrumentation International Workshop (FIIW) - Oak Ridge, TN, USA (2011.11.7-2011.11.8)] 2011 Future of Instrumentation International Workshop (FIIW) Proceedings - An active RFID Accountability System (RAS) for constrained wireless environments
Barker, Alan M., Hanson, Gregory R., Sexton, Angela K., Jones, J. P., Freer, Eva B., Sjoreen, Andrea L.Year:
2011
Language:
english
DOI:
10.1109/fiiw.2011.6476807
File:
PDF, 757 KB
english, 2011