[IEEE 2007 IEEE Conference on Computer Vision and Pattern Recognition - Minneapolis, MN, USA (2007.06.17-2007.06.22)] 2007 IEEE Conference on Computer Vision and Pattern Recognition - Two thresholds are better than one
Zhang, Tao, Boult, Terrance E., Johnson, R.C.Year:
2007
Language:
english
DOI:
10.1109/cvpr.2007.383500
File:
PDF, 1.54 MB
english, 2007