Bulk and surface densities of states of 0.3-μm-thick...

Physical Review B 1994 / 11 Vol. 50; Iss. 19

Bulk and surface densities of states of 0.3-μm-thick hydrogenated amorphous-silicon films using photothermal deflection spectroscopy

Leblanc, François, Maeda, Yoshihito, Onisawa, Ken-ichi, Minemura, Tetsuroh
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Volume:
50
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.50.14613
Date:
November, 1994
File:
PDF, 222 KB
english, 1994
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