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[IEEE 2008 3rd International Conference on Intelligent System and Knowledge Engineering (ISKE 2008) - Xiamen, China (2008.11.17-2008.11.19)] 2008 3rd International Conference on Intelligent System and Knowledge Engineering - Correcting sample selection bias for image classification
Di Wu,, Dinzhong Lin,, Li Yao,, Wenjun Zhang,Year:
2008
Language:
english
DOI:
10.1109/iske.2008.4731115
File:
PDF, 110 KB
english, 2008